Efficient Test Pattern Generator for BIST using Multiple Single Input Change Vectors

Design of accumulator Based 3-Weight Pattern Generation using LP-LSFR

The objective of the BIST is to reduce power dissipation without affecting the fault coverage. Weighted pseudorandom built-in self test (BIST) schemes have been utilized in order to drive down the number of vectors to achieve complete fault coverage in BIST applications. Weighted sets comprising three weights, namely 0, 1, and 0.5 have been successfully utilized so far for test pattern generati...

Multiple Single Input Change Vectors for Built-In Self Test (MSIC-BIST)

An Adaptive BIST to Detect Multiple Stuck-Open Faults in CMOS circuits

Design of an adaptive built-in-self-test (BIST) scheme for detecting multiple stuck-open faults in a CMOS complex cell is proposed. The test pattern generator (TPG) adaptively generates a subset of singleinput-change (SIC) test pairs based on the past responses of the circuit under test (CUT). The design is universal, i.e., independent of the structure and functionality of the CUT. The average ...

High Defect Coverage with Low-Power Test Sequences in a BIST Environment

and difficult aspects of the circuit design cycle, driving the need for innovative solutions. To this end, researchers have proposed built-in self-test (BIST) as a powerful DFT technique for addressing highly complex VLSI testing problems. BIST designs include on-chip circuitry to provide test patterns and analyze output responses. Performing tests on the chip greatly reduces the need for compl...

Single Core Hardware Modeling of Built-in-Self-Test for System on Chip Design

This study describes a hardware modeling environment of built-in-self-test (BIST) for System on Chip (SOC) testing to ease the description, verification, simulation and hardware realization on Altera FLEX10K FPGA device. The very high speed hardware description language (VHDL) model defines a main block, which describe the BIST for SOC through a behavioral and structural description. The three ...